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Scanning Electron Microscope (SEM) Model SH-5500P by HIROX offers a magnification capacity of up to 150,000x and integrates 5-axis fully motorized control for enhanced automation.
This model features an enlarged specimen holder, accommodating samples with a diameter of up to 80 mm and a thickness of up to 40 mm, enabling the inspection of larger specimens.
The SH-5500P allows voltage adjustments ranging from 1 to 30 kV, adjustable in 6 steps, ensuring versatile operation for various applications.
The specimen stage is highly flexible, offering the following adjustments:
User-friendly interface, allowing direct control of the rotation and tilt axes via a computer interface.
It also supports 3D reconstruction of structures by combining multiple inputs, utilizing either 2 SE stereo images or 4 BSE images, delivering detailed 3D visualizations for in-depth analysis.
The specimen stage is equipped with a built-in CCD camera, enabling users to view the interior and perform preliminary inspections before conducting precise measurements.
Resolution: 5 nm (SE), 8nm (BSE)
Magnification: Max. 150,000x
Voltage: 1kv ~ 30kv (1/5/10/15/20/30)
Detection: SE (Secondary Electron), BSE (Back scattered Electron)
Electron Gun: Tungsten Filament (cartridge)
Sample stage: X, Y : 40mm, R: 360° Z: 0~50mm, T: -15~90° – 5-axis (Fully Motorized)
Sample (Diameter/Height): 80mm/50mm
Vacuum System: High & Low Vacuum
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